In-situ Transmission Electron Microscopy

Transmission Electron Microscopy is a powerful tool for understanding the structure and composition of materials at nanometer length scales. However, limitations on beam dose, stability in vacuum, and other environmental parameters have made it difficult to perform certain types of experiments and analyses in the microscope. Lately, many of these barriers have been overcome through new detectors and sample holders. This presentation will focus on how new detectors and in-situ holders can be used for examining samples in liquids or gases, and while heating and/or electrically biasing samples. This allows us to look at samples in their native state, or watch as dynamic reactions or transformations happen in the microscope.