Introduction to Transmission Electron Microscopy (TEM)

In Transmission Electron Microscopy, a high energy electron beam is scattered as it is transmitted through a very thin sample which can provide information about the internal structure of the sample. There is a wealth of information that can be obtained at nanometer length scales from transmission electron microscopy including crystal structure, elemental composition and chemistry, phase distributions, dimensions of nanoscale structures, etc. In this overview, we will discuss the fundamental principles of TEM, the types of information that can be obtained from TEM, and the instrumentation available at PSU.