Zeiss Versa 620

Zeiss Versa 620

The Versa 620 offers capabilities that extend the limits of Micro-Nano-CT solutions.  

Capabilities include:

  • Non-destructive sub-micron scale microscopy of intact samples

  • Higher flux and faster scans without compromising resolution

  • True spatial resolution of 500 nm with a minimum achievable voxel size 40nm

  • High resolution across a broad range of sample types, sizes, and working distances

  • In-situ imaging for non-destructive characterization of microstructures in controlled environments and over time

  • Throughput with image quality