Image
The Versa 620 offers capabilities that extend the limits of Micro-Nano-CT solutions.
Capabilities include:
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Non-destructive sub-micron scale microscopy of intact samples
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Higher flux and faster scans without compromising resolution
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True spatial resolution of 500 nm with a minimum achievable voxel size 40nm
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High resolution across a broad range of sample types, sizes, and working distances
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In-situ imaging for non-destructive characterization of microstructures in controlled environments and over time
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Throughput with image quality