After Café: Evaluating Residual Stress and Strain States Using X-ray Diffraction Techniques

X-ray diffraction (XRD) techniques provide an attractive, nondestructive method to determine residual stresses by measuring atomic plane spacings in diffracting volumes and relating them to strain using the sin^2(psi) technique. This presentation will review the theory behind these calculations, identifying characteristics to look for during data analysis, a review of the advantages and limitations surrounding different experimental geometries, such as Bragg-Brentano and Grazing Incidence X-ray Diffraction (GIXRD), and an overview of MCL X-ray capabilities.  I will conclude with a short discussion about identifying when synchrotron x-ray capabilities may be appropriate for your specific experimental conditions.